Practical Electron Microscopy and Database - An Online Book
Table of Contents/Index 
Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
Chapter Y  
 Yields
  Electron emission and its coefficient under electron irradiation   SE yield (emission coefficient) in SEM 
  X-ray (fluorescence) yield/weight due to electron irradiation   SE yield depending on the incident angle of primary beam
  SE yield depending on accelerating voltage of primary electrons   Introduction of ionic sputtering yields
  Ionic sputter yield depending on grain orientation   Ionic sputtering yield in FIB
  Yield of Auger electrons   Yield of X-rays
Young
  Young’s experiment   Young’s fringes produced by TEM image shift (with and without monochromator)
  Spatial resolution of TEM measured by Young’s fringe   Young's moduli and melting temperature
Ytterbium (Yb) 
  Yb2O3    
  EELS measurements of yttrium (Y)    
  Yttrium-aluminum garnet (Ce-doped YAG)     Atomic-number contrast of yttrium ions
  Y2O3   Yttria-stabilized zirconia (YSZ)
  Ni-Yttria-stabilized zirconia (YSZ)   Cu-CeO-YSZ
  Y-based metallic-glass alloys    
 
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