Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Yields
Electron emission and its coefficient under electron irradiation			SE yield (emission coefficient) in SEM
X-ray (fluorescence) yield/weight due to electron irradiation			SE yield depending on the incident angle of primary beam
SE yield depending on accelerating voltage of primary electrons			Introduction of ionic sputtering yields
Ionic sputter yield depending on grain orientation			Backscattering coefficient (yield) of electrons
Yield of Auger electrons			Yield of X-rays
Yields in ion milling
Argon ion sputtering yield in milling			Ionic sputtering yield in FIB
Xenon ion sputtering yield in milling
Young
Young’s experiment			Young’s fringes produced by TEM image shift (with and without monochromator)
Spatial resolution of TEM measured by Young’s fringe			Young's moduli and melting temperature
Ytterbium (Yb)
Yb₂O₃
Yttrium (Y)
EELS measurements of yttrium (Y)
Yttrium-aluminum garnet (Ce-doped YAG)			Atomic-number contrast of yttrium ions
Y₂O₃			Yttria-stabilized zirconia (YSZ)
Ni-Yttria-stabilized zirconia (YSZ)			Cu-CeO-YSZ
Y-based metallic-glass alloys