Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Ultra
Ultrathin TEM specimen prepared by FIB milling			Ultrathin specimen preparation by low-energy Ar-ion milling
Ultrathin window (UTW) on EDS detector			Ultrastructure
Ultraviolet light			Vacuum levels and UHV (ultra-high vacuum) in EMs
Pumps for high and ultra-high vacuums			Ultrahigh voltage TEMs

Unequivocal space groups
Unoccupied density of states
Unoccupied energy levels in conduction band (EELS)
Underfocus in EMs
TEM contrast and underfocus			Underfocusing objective lens in TEMs
Defocus/overfocus/underfocus in Ronchigrams

Unit conversion, and chemical and physical constants
Unit cells in crystals (Space group)
High resolution TEM imaging dependence on unit cell size			Temperature dependence of unit cell volume in crystals
Determination of primitive unit cell by electron diffraction			Volume of unit cells
Number of lattice points (atoms) per unit cell			Asymmetric units in unit cells
Unknown
Determination of unknown crystal structures
Uranium (U)
EDS measurement of uranium (U)
Usable/Useful
Maximum usable illumination angle in STEM			Not all aberration correctors are useful/economic for EMs or applications (limitations)
Useful energy range in EELS measurements

Upper- & lower- objective polepiece in TEMs/STEMs			User training for EM operations