Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
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P
|
Q
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R
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S
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T
|
U
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V
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W
|
X
|
Y
|
Z
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Appendix
Chapter R
R-centered lattices/R-centering & its space groups
Trigonal
R3 (146)
R-3 (148)
R32 (155)
R3m (160)
R3c (161)
R-3m (166)
R-3c (167)
R-planes of sapphire crystal
Radiation damage in EMs
EELS detection limited by radiation damage
Effect of electron dose on radiation damage
Electron radiation damage depending on energy deposited in specimen
Electrostatic charging in EMs
Heat generation/temperature increase by electron irradiation
Effect of electron beam diameter on radiation damage
Electron dose inducing material damage in bulk and at sample surface
Inelastic collision (knock-on)
Ionization damage (radiolysis) by electrons
Displacement of atoms due to electron irradiation in EMs
Sputtering & its yield of materials in electron microscopes
Hydrocarbon (HC) contamination of EM specimens
Radial: Azimuthal and radial circles/Ronchigram in STEM
Radial distribution function (RDF) from electron diffraction patterns
Radiolytic process (radiolysis) induced by electron irradiation
Radiative stopping power
Radio
Radius of path of electrons/charged particles in a magnetic field
Radius of HOLZ rings
Radius ratio rule/limiting radius ratio
Radon transform
Random access memories
Raman spectra
Random distribution of atom positions
Effect of random distribution of atom positions on diffractograms
Range of energy losses of various EELS signals
Rare earth
Misfit layer chalcogenides: (AX)
1+δ
(BX
2
)
n
(A = rare earth/Sn/Pb/Sb/Bi; B = Ti/V/Cr/Nb/Ta; X = S/Se)
Rare gas solids
EELS of rare gas solids
Ratio techniques
Ratio technique for elemental quantification by EDS
Ratio of EDS peak intensities of two elements
Ratio of EDS peaks of the same elements
M
4
/M
5
ratio of EELS white lines
Determination of elemental ratio using EELS
Ratio of the L
3
to L
2
white-line intensity for 3d/4d elements
Rate of energy loss of incident electrons
RC time delays in ICs
Redeposition of sputtered atoms in FIB
Redistribution and redistribution rate of SEs
Reduced glass transition temperature
Refinement:
Crystallographic structure refinement
Reflection/Reflectivity
Film thickness determination by X-ray reflectivity/interference
Reflection electron energy loss spectroscopy (REELS)
Reflection electron detecting/amplifying system
Refraction
Refraction effect of secondary electrons
Refractive index
Refraction index of electron lenses
Reinstallation of Gatan DM on PC connected with TEM system
Relaxation of atoms excited by incident electrons
Relrod – a thin film diffraction effect in TEM
Relaxation
Structural relaxation of metallic glasses at elevated temperatures
Elastic relaxation due to TEM-specimen thinning
Reliability and long-term failure in ICs
Thermal stress for test of reliability and long-term failure in ICs
Reliability/reproducibility of EDS data & EDS system
Remanent polarization in ferroelectrics
Remote/computer application in EMs
Removal of atoms due to electron irradiation in EMs
Removal of scan noise in STEM data analysis
Removal of sample thickness variations in STEM data analysis
Rewritable
Rewritable phase-change optical memory disks
Rewritable digital versatile disks
Ray aberration
Rayleigh criterion
Real lens in EMs
Real space and reciprocal space
Electron wavefunction in image plane in real space and reciprocal space
Reciprocal space vector
Real space and reciprocal space in EMs
Diffraction intensity distribution in reciprocal lattices
Reciprocal lattice spacings
Real crystal spacings/d-spacings & d-Ratio
Brillouin zone
Wigner-Seitz cell
Conversion between reciprocal space vector and angle
Rechargeable lithium ion batteries
Reconstruction
Electron image series reconstruction with TEM
Weak phase object methods in image series reconstruction with TEM
Parabaloid method for image series reconstruction with TEM
Wiener filter method for image series reconstruction with TEM
Iterative wave function reconstruction for image series reconstruction with TEM
Reconstruction of off-axis holograms
Rectangle (box) annotation on Gatan DigitalMicrograph
Rectangle ROI on Gatan DigitalMicrograph
Rectangular symmetry in electron diffraction patterns
Resin
Resistive switching
Bipolar resistive switching in perovskite insulators
Resistivity/resistance (Electrical)
Table of electrical resistivity/conductivity of materials
Electrical resistivity/resistance of metallic glass depending on temperature
Polysilicon and diffused resistors
Temperature coefficient of resistance (TCR)
Electrical resistivity of materials studied by EELS
Resolving power/resolution of microscopes and spectrometers
External disturbances on resolution of EMs
Spatial resolution limits
Retention & retention loss in ferroelectrics
Responding time of secondary electron emission after electron irradiation
Retractable TV-rate camera
Rhenium
Rhenium Trioxide (ReO
3
)
Interaction of incident electrons with rhenium element
Rhodium (Rh)
EELS measurement of rhodium (Rh)
Rhombic Penrose tiling
Rhombohedral crystal systems
Trigonal & rhombohedral space groups
Relationship between the hexagonal and primitive rhombohedral unit cells
Examples of indexed electron diffraction patterns of rhombohedral crystals
Richardson-Lucy deconvolution
Rippling effect in FIB-EM sample preparation
Right-hand rule
Right-hand rule of Lorentz force vector
Right-hand rule for cross products
Rochelle salt/Seignette salt (NaKC
4
H
4
O6•4H
2
O)
Rock salt/Halite
Rocking-curve intensity oscillations within CBED
Rocking point/pivot point/tilt & shift and their purities in TEM
Ronchigram/shadow image/microdiffraction pattern in STEM
Ronchigram comparison between C
s
-corrected and uncorrected STEM conditions
Coherence of electron beam/interference pattern in STEM/Ronchigram
Aberration coefficients reflected in Ronchigram
Ronchigram at Gaussian/Scherzer focus
Ronchigram depending on accelerating voltage of electron beam
Ronchigrams of amorphous films
STEM alignment with Ronchigram
Defocus/overfocus/underfocus in Ronchigrams
Ronchigrams of crystalline films in STEM
Spherical aberration rings in Ronchigram
Aberration determination by focal sets of Ronchigram
Segmental Ronchigram autocorrelation function matrix (SRAM) for aberration correction
Electron Ronchigram contrast transfer function (CTF) in STEM
Aberration coefficient C
1,2
/A
1
: two-fold axial astigmatism and its corrections in TEMs
Correction of 3
rd
order star aberration (S
3
)
Axial coma (B
2
) correction with Ronchigram
Room/environment/installation of EM systems
Rotary vacuum pumps
Round magnetic lens
Differences between round and multipole lenses
Rotation
Image rotation in EMs
Rotationally symmetrical electron lenses/magnetic field
Image helical rotation and inversion when changing magnification or focusing
Rotation method for three dimensional (3D) electron diffraction recording
Rotation axis (1, 2, 3, 4 and 6 (C
n
)) in crystallography
Five-fold axis
Four-fold axis
Six-fold axis
Three-fold axis
Two-fold axis
Rotoinversion axis in crystallography
Roughing pumps
Ruthenium (Ru)
EELS measurement of ruthenium (Ru)
Rutherford (elastic) scattering
Rutherford cross-section
Rutherford (elastic) scattering and HAADF
Rutherford’s nuclear model
Model of beam broadening based on Rutherford scattering theory
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