Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

F-centered lattices/F-centering & their space groups

Orthorhombic
F222 (22)			Fmm2 (42)
Fdd2 (43)			Fmmm (69)
Fddd (70)
Cubic
F23 (196)			Fm-3 (202)
Fd-3 (203)			F432 (209)
F4₁32 (210)			F4-3m (216)
F-43c (219)			Fm-3m (225)
Fm-3c (226)			Fd-3m (227)
Fd-3c (228)
Others
Fm-35
Face pole (plane normal) in electron stereographic projection			Face-centered orthorhombic structure
Examples of direct electron detectors (e.g. Gatan K2, DE-20, Falcon II)
Far infrared			Factors limiting imaging and spectroscopy in TEM
Faraday’s law			Faraday cage/cup for probe current measurement in EMs
Failure in materials and devices
Failure modes of light emitting diodes (LEDs) and laser diodes (LDs)			Reasons causing electron filament (gun) failure
TEM techniques for failure analysis of IC devices
Face-centered cubic (fcc) crystal structures
9R structure at grain boundaries in FCC materials			BCC structure at grain boundaries in FCC materials
<110> tilt twin and grain boundaries in FCC materials			HCP structure at grain boundaries in FCC materials
Standard indexed diffraction patterns for fcc crystals			Electron diffraction of face centred cubic (fcc) lattices
fcc-type packing short range ordering of metallic glass			Diffraction comparison between different cubic crystal structures
Examples of indexed electron diffraction patterns of FCC crystals			Determination of Burgers vector of fcc lattice defects

Fans			FeCoN
FEI Corporate
FEI TEMs			FEI TEM operation manuals

Fermi energy of materials			Fermi’s Golden Rule
Fe₂O₃ (hematite/haematite)
Ferroelectrics & Ferroelectric materials
Analysis techniques for ferroelectric materials			EELS analysis of ferroelectric materials
Ferroelectric & ferroelastic interactions			Properties of ferroelectric crystals
Polar point groups for ferroelectricity			Piezoresponse atomic-force microscopy (PFM)
Four-dimensional scanning transmission electron microscopy (4D STEM)			Four-dimensional (4D) STEM-EELS
Corrections of Spatial Drift between Successive Acquisitions in 4D STEM Measurements			Four-dimensional (4D) STEM-diffraction
Crystalline and semicrystalline orientation mapping with Four-dimensional (4D) STEM
Perovskite-like ferroelectrics			Classifications of ferroelectric materials
Curie-Weiss temperature in ferroelectrics			History of ferroelectricity
Order–disorder ferroelectrics			Ferroelectric random access memories (FeRAMs/FRAMs)
Comparison between different memories			Displacive ferroelectrics
Ferroelectrics: Phase transitions inducing ferroelectricity
First-order ferroelectric phase transitions			Second-order phase transitions
Ferroelectrics: Spontaneous polarization in ferroelectrics
Remanent polarization in ferroelectrics			Direction of spontaneous polarization in ferroelectrics
Angle between polarization vectors of adjacent domains in various crystalline phases in ferroelectrics			Polarization in ferroelectrics measured by CBED in STEM mode
Ferroelectric properties: Table of characteristics of some specific ferroelectric materials
Dielectric constant of ferroelectric crystals			Ferroelectric dielectric hysteresis & hysteresis loop
Coercive field in ferroelectrics			Curie temperature/Curie point in ferroelectrics
Domain in ferroelectric materials			Strain/stress in ferroelectric materials
Degradation/failure in ferroelectrics			Aging in ferroelectrics
Ferroelectrics: Major electrical long-term failure mechanisms
Fatigue in ferroelectrics			Retention & retention loss in ferroelectrics
Imprint in ferroelectrics
Ferroelectrics: Physical failure mechanisms
Stability of ferroelectrics related to oxygen vacancies
Ferromagnetics and ferromagnetic materials
Curie temperature/Curie point in ferromagnetics
Fibers
Infrared optical fibers			Fiber/biprism filament in Möllenstedt–Düker biprism for off-axis electron holography
CCD sensors/detectors with phosphor and fiber-optic coupling
Field Effect Transistor (FET) preamplifier in EDS systems			Field astigmatism in EMs
Generating a pulsed electron beam using field emission with modulated voltage in EMs
Fifth-order aberration correction			Fifth-order 6-fold astigmatism & its corrections
Five (5)-fold rotational symmetry
Field lines
Magnetic field lines
Field of view
Aberrations and imaging requirements for small field of view in EMs			Aberrations and imaging requirements for large field of view in EMs
Off-axial coma and field of view			TEM specimen traverse induced by specimen tilting
Filaments in EMs
LaB₆ filament			Field-emission gun
Comparison between different electron sources/guns
Comparison between EFG(field emission)-TEMs and CTEMs (LaB₆ and tungsten)			Future developments and possibilities of field emission guns
Filters & fitting techniques
Energy filters to improve energy spread in EMs and EELS			Filters (devices)
Fourier filtering/masking			Digital-filtered least-squares peak fitting for EDS quantification
Linear least squares fitting technique			Filter kernels in image processing
Prewitt edge filter (operator)			Sobel edge filter (operator)
Top-hat filtering and bottom-hat filtering			Top-hat filter for EELS

Fine probe/beam formation in EMs
Fine structure of ionization edges in EELS
Effect of chromatic aberration on fine structure analysis using EFTEM

Finish-start/right-hand (FS/RH) convention & Burgers circuit			Firewire (Peripheral Component Interconnect) PCI card
First order Laue zones (FOLZ)
Standard FOLZ diffraction patterns for various crystal structures			Shift of HOLZ patterns relative to ZOLZ patterns

Fingerprint related contamination in EMs			First Bethe approximation/two-beam conditions in TEM measurements
First-order Born approximation/Born series			First-order ferroelectric phase transitions
Flashing electron guns			First-order phase transitions
Fluctuation microscopy
Fluorescence
Secondary X-ray (Fluorescence) in EDS measurements			Viewing screen/fluorescent screen in EMs
Fluorine
EDS measurement of fluorine (F)			EELS measurement of fluorine (F)
XPS of fluorine and its related materials			Fluorine contamination in IC chips
Fluorides
CF₄ gas			Calcium fluoride (CaF₂)
Ammonium fluorosilicate [(NH₄)₂SiF₆]			XeF₂

Flyback time: set flyback time in DigiScan image to avoid image distortion			Focal series of TEM images
Focal length of magnetic lenses
Focal length of objective lens			Focal point in electromagnetic lenses
Focus
Difference of focus depth for inelastic (core-loss EFTEM) and elastic imaging			Focused convergent incident electron beam
Marginal ray focus			Paraxial ray focus
Depth of focus in EM			Focusing properties of electromagnetic lenses affected by aberrations
Aberration correction through-focus series reconstruction			Line focus in EMs
Cross-over formed by focusing electron beam			FIB lithography
Focusing & Defocusing in EMs
Focused ion beam (FIB) systems
Introduction of lens/real lens in EMs and FIBs			Dual beam FIB/SEM
Companies/manufacturers producing FIB instruments			Models of FIB systems
Examples of FIB specifications			Cryo-focused ion beam (FIB)
Ion extractor in FIB			Ion channeling on FIB measurements
Beam suppressor in FIB			Resolution of FIB milling
Lateral ranges of probe ions in FIB and SIMS			Practical beam current of FIB technique
Ion irradiation dose			Spray & beam defining apertures in FIB
Beam blanking deflector in EMs and FIB			Octopole and other lenses in FIB
Working distance in FIB processes			Sample stage in FIB systems
Comparison between FIB, electron beam and laser beam techniques
FIB: Ion sources for FIB			FIB Precursor Gas Chemistries for Ion-beam/FIB/Electron-beam Induced Etching and Deposition Processes
Liquid-metal ion source (LMIS)			Gallium source in dual beam FIB/SEM & single beam FIB
Alloy liquid metal ion sources for advanced FIBs			Properties of accelerated charged particles
FIB process and its applications			Convergence semi-angle of the ion beam in a FIB system
FIB circuit edit (modification)
Passive voltage contrast (PVC) in FIB and SEM			Active voltage contrast (AVC) in FIB and SEM
Positive charging case of PVC in FIB and SEM			Voltage contrast in FIB and SEM
Smallest structures obtained by dual beam SEM/FIB/STEM deposition			Gas-assisted etching in FIB milling
FIB induced deposition			Charging enhanced electron/ion-beam-induced-deposition
Sample charging in FIB processes			Secondary electron emission by ion irradiation
Redeposition of sputtered atoms in FIB			Grain size/boundary determination by FIB
Tomographic properties of SEM and dual-beam techniques
FIB ionic sputtering
Introduction and theory of ionic sputtering yields (in FIB & SIMS)			Table of ionic sputtering yields and rates in FIB & SIMS
Introduction and theory of milling rate of materials in FIB			Angular dependence of milling in FIB
Time-efficiency/speed of FIB milling			Ionic sputter yield depending on grain orientation
Penetration depth/implant depth/trajectory of ions in FIB milling			Vacancy & interstitial generation in FIB milling
Polymer TEM sample preparation
FIB-irradiation-induced bending
Stress-redistribution-induced film bending due to FIB irradiation			Thermo-plastic expansion induced film bending due to FIB irradiation
Focused ion beam: TEM sample preparation by FIB			In situ FIB lift-out TEM sample preparation
Advantages and disadvantages of FIB technology for EM sample preparations			Mounting of TEM grid in grid-holder of FIB system
Conventional cross-section FIB TEM specimen preparation method			“Lift-out” FIB-TEM specimen preparation technique
Wedge FIB milling method for TEM specimen preparation			Examples of experimental conditions for FIB specimen preparation
Ultra-thin TEM specimens prepared by FIB milling			Point defects created in FIB-EM sample preparation
Rippling effect in FIB-EM sample preparation			Curtaining effect in FIB-EM sample preparation
Comparison between FIB and Ar (argon) ion milling specimen preparations
Focused ion beam (FIB): Ion-beam induced structural change/damage at surfaces
Preferential destruction of multilayers in FIB milling			Amorphous layer formed during EM sample preparation using FIB
Plasma cleaning of FIB prepared specimens			Double cross-sections for examing damage of prepared EM sample surface
Dopant deactivation induced by FIB sample preparation			Gallium contamination due to FIB milling & in FIB deposits
Specimen quality depending on sample tilting in FIB			Melting/temperature rise of materials in FIB processes
TEM lattice fringe affected by FIB damage			Amorphization of materials due to FIB deposition
"Mottling" visible in FIB and Ar-milled specimens			Sidewall implantation in TEM sample preparation with FIB

Folding/convolution of functions
Forbidden reflections/diffraction spots in diffraction patterns
Gjönnes-Moodie extinctions in electron diffraction patterns			Existing of extinction bands within forbiddden reflections in CBED patterns
Extinctions and weak spots showing in electron diffraction patterns of diamond, silicon, germanium, and Tin (Sn)			Double/multiple diffraction in electron diffraction patterns
Formation
TEM image formation process
Four-fold
Four-fold astigmatism & its measurement and correction			Four-fold rotational symmetry & its axis in crystals
Fourier: Discrete/continuous/fast Fourier transform (DFT/CFT/FFT)
iFast (Integrated Fast Automation Software Technology)
Fourier (transform/transformation) lens			Additional spots due to inadequate gain normalization (in diffractograms obtained by Fourier transformation)
Relationship between lens & Fourier transformation			Uneven illumination effect on Fourier transform in TEM
Fourier filtering/masking			Astigmatism effect on Fourier transform
Relationship between electron diffraction & image and Fourier transform			Fourier coefficients of electrostatic potential
Fourier transform of EEL spectra and images			Streaking artefacts in FFTs of TEM images
Fourier deconvolution techniques for EELS/EFTEM
Fourier-log method for EELS deconvolution			Fourier-ratio method for EELS deconvolution
Fourier transform: Fourier transform & Phase of Fourier components in HRTEM images
Accuracy of lattice spacing measurements by HRTEM/FFT/electron diffraction			Fourier transform and FFT of HRTEM image of crystalline materials
Fourier transform and FFT of HRTEM image of amorphous materials			Accuracy of angle measurement in HRTEM and FFT images
Fraction
Fraction of absorbed electrons depending on sample thickness			Fraction of transmitted electrons depending on sample thickness
Fraction of backscattered electrons depending on sample thickness			Fraction of electrons scattered onto an ADF detector
Dependence of crystallized fraction on annealing time and temperature

Frank’s rule in dislocation theory			Fraunhofer diffraction
Frenkel pair			Free-electron and interband transition metals
Free-electron metals			Free energy (Gibbs)
Fowler-Nordheim (F-N) distribution
Free volume in metallic glasses
Free volume determination in metallic glasses			Coordination number dependence on free volume in metallic glass
Free volume change of metallic glasses at elevated temperatures			Analysis of free volume of amorphous materials using electron diffraction
Free volume change in amorphous materials induced by deformation

Freon and its application in EMs
Fresnel fringes in TEM images
Defocus Affecting Fresnel fringes			Factors affecting Fresnel fringes
TEM contrast/fringes at interface between two materials			Spatial resolution affected by objective astigmatism
Overfocus in EMs			Underfocus in EMs
Fresnel fringes affected by objective astigmatism and its correction			Dependence of Fresnel fringes on TEM specimen thickness
Beam divergence effects on Fresnel fringes			Crossed lattice fringes to form HRTEM images
Friedel (or Bijvoet) pair & Friedel's law
Departure from Friedel’s law in CBED patterns
Fringes
Fringe spacing in electron holography			Pendellösung fringes in crystals
Kossel-Möllenstedt (K-M) fringes			Lattice-fringe/structural fingerprinting
Lattice-fringe visibility & its band & band broadening			Lattice-fringe visibility maps
TEM lattice fringe affected by FIB damage

Front focal plane of objective lens
Fuel Cells
Solid oxide fuel cells (SOFC)

Full-frame transfer (FT) CCD			Funnels used to fill cold traps with liquid nitrogen for EMs
Full width at half maximum (FWHM) of emitted SE distribution			Full width at half maximum (FWHM) of X-ray diffraction lines
Functions in Gatan digital micrograph