Crossed Lattice Fringes to Form HRTEM Images
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Crossed lattice fringes in HRTEM imaging are caused by the diffraction of the incident electrons after penetrating through the specimen and appear as periodic light and dark bands in the image. The crossed lattice fringes are formed by the intersection of two or more sets of lattice fringes and are visible when the crystal (e.g. nanocrystal) is oriented close to a zone axis. The primary characteristics in the fringes are the spacing of the lattice fringes and the angle between intersecting lattice fringes.

 

 

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