Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

K edges  
K-edge of 3d transition elements in EELS  
 
k-factor correction due to sample thickness effect (x-ray absorption)  
k-factors in EDS/x-rays k-space
K-shell binding energy K-family (Kα & Kβ) X-ray emission
K-shell ionization cross section  
Kalium (K)
Kalium contamination in IC devices  
 
Kernel size in NSS EDS analysis (Filter) kernels in image processing
Kikuchi lines & bands in electron diffraction
Indexing Kikuchi lines Si Kikuchi pattern  
Kikuchi diffraction pattern from Si [103] zone axis Evaluation of grain orientation based on Kikuchi lines/bands
Energy filter applied to observation of Kikuchi lines and bands Backscattered Kikuchi diffraction (BKD)
Kikuchi lines & bands in EBSD Kikuchi pattern contrast of EBSD depending on amorphous layer on surface 
CBED Kikuchi pattern contrast depending on samples thickness Overall electron diffraction and Kikuchi lines depending on TEM sample thickness
Alignment of zone axis following Kikuchi lines by tilting EM samples Visibility of Kikuchi lines
 
Killer particles causing IC failure  
Kinematically diffracted electron and X-ray beams & their intensities
Two-beam kinematic electron scattering/diffraction Kinematic & quasi-kinematic scattering of electrons
Kinematical effects of PED (precession electron diffraction) Kinematically forbidden reflections in electron diffraction patterns
Kinetic energy of particles (e.g. ions and electrons) 
Relation of kinetic energies of secondary electrons in vacuum and specimen  Kinetic energy of electrons after passing specimen in TEM  
Measurement of kinetic energy of electrons Spread of the kinetic electron energy   
Kinetic energy of secondary electron  
 Knock-on damage in EM measurements
Energy transfer for atomic displacement/knock-on process due to electron irradiation Knock-on threshold of chemical elements due to electron irradiation in bulk
Knock-on threshold of chemical elements due to electron irradiation at sample surface Minimization of atom knock-on in EMs
Cross-sections of surface sputtering/knock-on induced by electron irradiation Sputtering/knock-on of atoms from beam-exit surface of TEM sample
 
KOH (potassium hydroxide) etching  
Kossel-Möllenstedt (K-M) fringes Kossel lines in x-ray diffraction
Kramers–Kronig analysis Kramers' law: intensity of bremsstrahlung X-rays