This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The contrast of the observed CBED Kikuchi patterns in TEM depends strongly on the TEM sample thickness [1 - 2]. Note that thick TEM specimens give faded HOLZ patterns that make the analysis difficult because of inelastically scattered electrons in the specimen. However, energy filtering enhances HOLZ line contrast in CBED and enables us to study the HOLZ patterns from a thick specimen.

[1] Pfister, H. (1953) Elektroneninterferenzen an Bleijodid bei Durchstrahlung im konvergenten B¨ undel. Annal. Phys. 446, 239–269. Pogany, A.P.&Turner, P.S. (1968) Reciprocity in electron diffraction and microscopy. Acta Cryst. A 24, 103–109.
[2] Reimer, L. & Kohl, H. (2008) Transmission Electron Microscopy—Physics of Image Formation. 5th edn. Springer, Berlin.