This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In many cases, CBED analysis is improved by removing the inelastically scattered electrons by means of an electron energy filter. The energy filter can be set to a typical energy window of ~10 eV around the elastic peak. The energy filtering enhances HOLZ line contrast in CBED and enables us to study the HOLZ patterns from a thick specimen.