Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

   
Jahn–Teller effect JCPDS cards for XRD analysis
JEOL TEMs
JEM-ARM 200F TEM JEOL JEM-2010F TEM
JEOL 2100 TEM operation manual
Job positions and salary for electron microscopists Joint density of states (JDOS)
Junctions
Passive voltage contrast (PVC) of pn-junction structures/diodes Junction shorts in ICs
Jump & drift of EEL spectra or images Jump ratio in EELS measurement