JCPDS Cards for XRD Analysis
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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As shown in Figure 2496 (for NaCl here), each XRD JCPDS (Joint Committee on Powder Diffraction Standards) card contains the following information:
        The file number,
         The three strongest lines,
         The lowest angle line,
         The chemical formula,
         The data on diffraction method used,
         The crystallographic data,
         The optical and other data,
         The data on specimen,
         The data on diffraction pattern.

It is very common that all the information above is an integral portion of the software coming with the instrumentation.

Example of JCPDS cards

Figure 2496. Example of XRD JCPDS cards. The star at the top-right corner indicates the quality of the data.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.