This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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As shown in Figure 2496 (for NaCl here), each XRD JCPDS (Joint Committee on Powder Diffraction Standards) card contains the following information:
        ➀ The file number,
        ➁ The three strongest lines,
        ➂ The lowest angle line,
        ➃ The chemical formula,
        ➄ The data on diffraction method used,
        ➅ The crystallographic data,
        ➆ The optical and other data,
        ➇ The data on specimen,
        ➈ The data on diffraction pattern.

It is very common that all the information above is an integral portion of the software coming with the instrumentation.

Figure 2496. Example of XRD JCPDS cards. The star at the top-right corner indicates the quality of the data.