Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Challenges in in-line SEM inspection on wafers
Water cooling in EMs			Water (H₂O) ice in EM measurements
ExSolve Wafer TEM Prep DualBeam, TEMLink and Thermo Fisher Metrios TEM
Wave properties of charged particles
Wave aberration function			Influence of diffraction on quantum wave of charged particles
Wave-particle duality
Wave vector
Wave vector of incident electrons			Scattering vector/transferred wave vector after electron scattering with matter
Wave vector of scattered electrons in TEM
Wavefunction: Electron wavefunction
Plane wave of electron beam			Plane wave and interference pattern in electron holography
Wavefunction in defocusing plane in TEM imaging			Wavefunction affected by aberrations in CTEM
Wavefunction affected by aberrations in STEM			Exit plane/object wave function from TEM specimen
Electron wavefunction in image plane in real space and reciprocal space			Wave function of focused probe in STEM/SEM
Exit wavefunction & intensity from STEM specimen

"Waveguide" effect in EMs
Wavelength
Wavelength/electron velocity/high voltage			Wavelength of lights
Wavelength (energy) of X-ray "particles" (photons)
Wavelength dispersive X-ray spectroscopy (WDXRF/WDS)
Comparison of various X-ray spectrometers
Weak
Weak-phase-objects (WPO) in TEM & weak phase object approximation (WPOA)			Weak scattering in some materials in TEM observations
TEM sample thickness satisfying weak phase criterion			Weak phase object methods in image series reconstruction with TEM
Extinctions and weak spots showing in electron diffraction patterns of diamond, silicon, germanium, and Tin (Sn)			Energy filter applied to observation of weak reflections in electron diffractions
Weak spots related to superstructures in electron diffractions			Pseudo-weak phase-object approximation
Weak-beam (WB) technique in TEM

World Wide Web (website) & Internet for electron microscope and materials			Wedge mask annotation on Gatan DigitalMicrograph
Wedge-shaped structures
EDS artifact of wedge-shaped TEM specimen			Applications of wedge-shaped TEM specimen in EM analysis
Wedge polishing method for TEM specimen preparation			Wedge FIB milling method for TEM specimen preparation

Wehnelt unit in electron source			Weiss zone law
White lines in EELS			Whole-pattern symmetry
Width
Zero-loss peak in EELS and its broadening/width			Width of energy peaks/edges in EELS spectrum
Widths of X-ray peaks in EDS measurement			Interference width in off-axis hologram
Widths of dislocations			Line Edge Roughness (LER) and LWR (Linewidth Roughness) in CD (Critical Dimension) measurements
Window
Vacuum sealed electron transparent windows for in-situ TEM			Windowless' EDS detector
Infrared windows			X-ray absorption in detector windows

Wien filter			WIEN2k
Wiener filter method for image series reconstruction with TEM			Wigner-Seitz cell

Copper windings of wire in electromagnetic lenses
Wobblers in EMs
Wobbler for condenser lens excitation in TEM/STEM			Wobbler for high tension (HT wobbler) in TEM/STEM
Wobbler for coma-free alignment with beam tilt			Wobbler for pivot point/rocking point/(Shift X/Y & Tilt X/Y, purity or balance)
Wobbler for finding Eucentric height of specimen in TEM			Anode wobbler in TEM
Working distance
Working distance in SEM and its effects on image contrast			Working distance in FIB processes
Wulff net
Angle between two planes/plane normals/poles measured by Wulff net			Aberrations versus working distance in SEMs

Wurtzite structure			Wyckoff positions