Wavefunction Affected by Aberrations in CTEM
- Practical Electron Microscopy and Database -
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The lens aberrations affect the wavefunction in CTEM and thus affect the image formation. The wavefunction after the aberration consideration can be given by multiplying the electron wave in reciprocal space, ψ(k), by the phase factor dependent on the wave aberration function exp[iχ(k)]. The wavefunction at the image plane can be written by,

           Wavefunction Affected by Aberrations in CTEM ----------------- [3747a]

where,
          A(k) -- The circular function

Therefore, the image intensity, I(r), at the imaging plane can be given by,

           Wavefunction Affected by Aberrations in CTEM ------------------------ [3747b]
                            Wavefunction Affected by Aberrations in CTEM ------------------------ [3747c]

The wavefunction at the back focal plane, ψ'(k) , can be given by,

           Wavefunction Affected by Aberrations in CTEM ------------------------ [3747d]

 

 

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