Wave Vector of Incident Electron
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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For instance, for TEM (transmission electron microscope), the primary electron beam typically with voltages of 100 to 300 keV at convergence half angle α interacts with a specimen sufficiently thin as shown in Figure 4364. An aperture (e.g. objective aperture) defines at the level of the specimen a solid angle of collection (acceptance half angle β of a few mrad). During this interaction, the occurred scattering events provide the information of momentum transfer q and of energy transfer ΔE. Note that some references use the convention of |ki| = 2π/λ, while some use |ki| = 1/λ.

incident electron of wave vector ki , scattered electron wave vector kf, transferred wave vector q, and energy transfer ΔE

Figure 4364. Schematic diagram showing wave vector ki of incident electron, scattered electron
wave vector kf, transferred wave vector q, and energy transfer ΔE. 

 

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