This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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For instance, for TEM (transmission electron microscope), the primary electron beam typically with voltages of 100 to 300 keV at convergence half angle α interacts with a specimen sufficiently thin as shown in Figure 4364. An aperture (e.g. objective aperture) defines at the level of the specimen a solid angle of collection (acceptance half angle β of a few mrad). During this interaction, the occurred scattering events provide the information of momentum transfer q and of energy transfer ΔE. Note that some references use the convention of |k_i| = 2π/λ, while some use |k_i| = 1/λ.