Wavefunction Affected by Aberrations in STEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

From wave aberration function, in STEM the wavefunction after aberration consideration can be calculated. The wavefunction affected by the aberrations is the inverse Fourier transform of the aperture function A(k) in the back focal plane, including the phase change due to aberrations and an aperture. Therefore, the wavefunction in the back focal plane is given by,

          Wavefunction Affected by Aberrations in STEM ------------------------ [3741]

where,
                     k -- The two dimensional vector in the back focal plane

Note that the off-axis aberrations are negligible in the case of high-resolution TEM imaging and STEM [1].

 

 

[1] S. Uhlemann, M. Haider, Ultramicroscopy 72 (1998) 109.

 

=================================================================================

The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved