Aberrations versus Working Distance in SEMs
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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If an asymmetric pinhole lens (or called asymmetric conical lens) is applied in a SEM system, the aberrations of the microscope will increase with the working distance.

 

 

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