Electron Wavefunction in Image Plane
in Real Space and Reciprocal Space
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 3730 gives a very simplified illustration of how the incident electrons travel through the TEM column. r is the real space coordinates in the sample or image, u is the reciprocal space coordinates and θ is the scattering angle.

TEM Image Formation Process

Figure 3730. Simplified illustration of how an image is formed in a TEM column.

Assuming that in the image plane of a TEM the electron wavefunction is given by ψ(x) in real space and φ(k) in reciprocal space, the two wavefunctions correlate each other through the form of Fourier transform, given by,

            Electron Wavefunction in Image Plane in Real Space and Reciprocal Space ----------------------- [3730a]

In reciprocal space the electron wavefunction φ(k) is related to the wavefunction φE(k) on the exist face of the TEM film through the expression given by,

             Electron Wavefunction in Image Plane in Real Space and Reciprocal Space ----------------------- [3730b]

where,
          T(k, |g|) -- The contrast transfer function (CTF)

 

 

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