Wavefunction in Defocusing Plane in TEM Imaging
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.

 

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If a parallel electron beam is normal to a specimen, the wavefunction in the defocusing plane of ±Δf can be given by

       wavefunction in the defocusing plane --------- [4213a]

where,
       ψ(x,y) -- Wavefunction in the specimen plane
       Δf -- Defocus
       (x, y ) -- Coordinates of the specimen plane
       (xi, yi) -- Coordinates of the defocusing plane
       λ -- Wavelength of the electron beam
       wavefunction in the defocusing plane --------------------------------- [4213b]
       wavefunction in the defocusing plane --------------------------------- [4213c]

 

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