Kinematically Diffracted Electron and X-ray Beams & Their Intensities - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Accurate structure factor intensities can be obtained for all reflections from single crystal X-ray diffractions. Determination of crystal structure factor phases can be done through direct methods, Patterson method, charge-flipping algorithm or maximum entropy method, in combination with single crystal X-ray diffraction.
Table 1613. Examples of kinematically diffracted electron and X-ray beams & their intensities.
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