Energy Filter Applied to Observation of Kikuchi Lines and Bands
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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There is a contribution of inelastically scattered electrons to the conventional electron diffraction patterns (refer to thickness dependence and atomic number dependence) so that energy filtering at high energy losses can be used to separate the contributions from plasmon and inner-shell ionization losses to Kikuchi lines and bands.

 

 

 

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