|
Kalium Contamination in IC Devices
- Practical Electron Microscopy and Database -
- An Online Book -
|
https://www.globalsino.com/EM/
|
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
|
=================================================================================
Table 2433. Kalium contamination in IC devices.
Contaminated area |
Contaminant |
Contamination sources |
Effects |
Bond-pad |
Kalium |
Introduced by package paper during shipping |
Induce non-sticking bond pad |
|
=================================================================================
The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
|
|