This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Starting from the two-beam kinematic diffraction theory, when the TEM sample thickness is very small, the extension (H) of the reflection in reciprocal space is very large. Therefore, Q is much smaller than πH so that the two-beam dynamical scattering theory can be approximated by two-beam kinematic diffraction theory, which suggests the intensity of an <hkl> diffracted beam given by,

          ------------------------ [2713a]
          ------------- [2713a]
where,
         I₀ -- The intensity of the incident electron beam,
         S -- The illuminating area by the incident electron beam,
         Φ_hkl -- Fourier coefficients of an electrostatic potential,
         F_hkl -- The structure factors,
         A -- The thickness of the crystal in the TEM specimen,
         H -- The extension of the reflection in reciprocal space,
         σ -- The interaction constant between the incident electrons and specimen,
         Θ -- The half of the angle between the transmitted and scattered electron beams,
         ξ_hkl -- The extinction distance.

In the kinematic theory, the integrated reflection coefficient is given by,

          ------------- [2713c]

where,
         L -- The Lorentz factor in unit of length.