This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
Starting from the two-beam kinematic diffraction theory, when the TEM sample thickness is very small, the extension (H) of the reflection in reciprocal space is very large. Therefore, Q is much smaller than πH so that the two-beam dynamical scattering theory can be approximated by two-beam kinematic diffraction theory, which suggests the intensity of an <hkl> diffracted beam given by,
I0 -- The intensity of the incident electron beam,
S -- The illuminating area by the incident electron beam,
Φhkl -- Fourier coefficients of an electrostatic potential,
Fhkl -- The structure factors,
A -- The thickness of the crystal in the TEM specimen,
H -- The extension of
the reflection in reciprocal space,
σ -- The interaction constant between the incident electrons and specimen,
Θ -- The half of the angle between the transmitted and scattered electron beams,
ξhkl -- The extinction distance.
In the kinematic theory, the integrated reflection coefficient is given by,
L -- The Lorentz factor in unit of