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Interaction Constant/Parameter (between Incident Electrons and Specimen)
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The interaction constant (or called parameter) between incident electrons and a specimen is defined as,
 -------------------------------- [2734]
where,
m -- The relativistic mass of the electron,
e -- Tthe elementary charge,
λ -- The electron wavelength,
h -- Planck’s constant.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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