
Interaction Constant/Parameter (between Incident Electrons and Specimen)
 Practical Electron Microscopy and Database 
 An Online Book 

http://www.globalsino.com/EM/

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The interaction constant (or called parameter) between incident electrons and a specimen is defined as,
 [2734]
where,
m  The relativistic mass of the electron,
e  Tthe elementary charge,
λ  The electron wavelength,
h  Planck’s constant.

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