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Reasons Causing Electron Filament Failure - Practical Electron Microscopy and Database - - An Online Book - |
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| Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
| This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. | ||||||||
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Discharging is a common reason of causing electron-filament failure. Therefore, in order to avoid electrical discharge between the anode and cathode (filament/shield), the region of electron gun needs high vacuum. When filaments (especially for FEGs) are in use, they are particularly sensitive to oxygen that also causes filament failure.
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| The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. | ||||||||
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