Electron microscopy
 
Reasons Causing Electron Filament Failure
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Discharging is a common reason of causing electron-filament failure. Therefore, in order to avoid electrical discharge between the anode and cathode (filament/shield), the region of electron gun needs high vacuum. When filaments (especially for FEGs) are in use, they are particularly sensitive to oxygen that also causes filament failure.

 

 

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