This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The electron wavefunction in the front focal plane is a function of scattering semi-angle α, given by,

          --------------------- [2773]
where,
          χ -- The phase shift induced by objective lens.

For an ideal lens, χ(α) is equal to 0.

Figure 2773 shows the full view of of the practical double-sextupole C_s correctors for STEM and for TEM, respectively. The positions of the correctors with respect to the front and back focal planes for STEM and TEM, respectively, are also indicated.