Factors Limiting Imaging and Spectroscopy in TEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book

 

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As problems associated with electron optics and stability have been overcome, for instance, when field-emission sources and aberration-corrected TEM lenses have been used, radiation damage becomes the main physical limit to imaging and spectroscopy in a TEM.

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
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