Fraction of Transmitted Electrons Depending on Sample Thickness  Practical Electron Microscopy and Database   An Online Book  

Microanalysis  EM Book https://www.globalsino.com/EM/  


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As an examlpe of interaction between incident electrons and matters, Figure 1183a shows the fractions of the transmitted (η_{T}) and backscattered (η_{B}) electrons from some Al films with an incident electron beam at accelerating energies of 15 keV and 20 keV, respectively. Those fractions are thicknessdependent. The data was obtained with Monte Carlo calculations. [1] It is reasonable that the fraction of transmitted electrons at higher voltages (20 keV) is much larger than that at lower voltages (15 keV).
Figure 1183b shows the fraction of transmitted electrons at different accelerating voltages of incident electron beam obtained by Monte Carlo modeling from some materials.
[1] R Shimizu, Y. Kataoka, T. Ikuta, T. Koshikawa and H. Hashimoto, A Monte Carlo approach to the direct simulation of electron


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