This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Figure 4172 (a) shows a HRTEM image of an Au particle on a very thin amorphous W/WO₂ film and (b) shows that Fourier transformation of the image (a) produced diffractogram. The additional spots from hexagonal fiberoptic array in (b) were due to inadequate gain normalization.

Figure 4172. (a) HRTEM image of an Au particle on a very thin amorphous W/WO₂ film and (b) Fourier transformation of (a). [1]

[1] M. A. O’Keefe, C. J. D. Hetherington, Y. C. Wang, E. C. Nelson, J.H. Turner, C. Kisielowski, J. -O. Malm, R. Mueller, J. Ringnalda, M. Pane, and A. Thust, Sub-Ångstrom high-resolution transmission electron microscopy at 300 keV, Ultramicroscopy 89 (2001) 215–241.