Two-beam Diffraction Conditions/First Bethe
Approximation in TEM Measurements
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In two-beam conditions in TEM, low index reflections are normally excited instead of high index reflections.

It is difficult to obtain diffraction disks in CBED and true 'two-beam' kinematic conditions from the small reciprocal lattice dimensions in some materials with the large lattice parameters.

Defocus CBED using high-index reflections provides a more accurate determination method of displacement vectors (R) of stacking faults than two-beam method with exciting low-index reflections, selected area electron diffraction method with low index reflections, and HRTEM technique.

Table 3769. Applications of two-beam diffraction conditions.

Applications Page
Sample thickness determination using CBED page4622
Determination of Burgers vectors of dislocations page3463

 

 

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