Dependence of Fresnel Fringes on TEM Specimen Thickness
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

Fresnel fringes in TEM images depend on the TEM specimen thickness. Therefore, anticontaminator is often used to minimize carbon (C) contamination which increases the thickness of the specimen and thus makes the observation of the fringe more difficult.

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.