Polymer TEM Sample Preparation - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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In Focused Ion Beam (FIB) TEM sample preparation, polymer tends to bend, roll and melt under FIB induced thermal stress [1]. Actually, delamination of the stacked metal and polymer layers can be possible. Sample-mount method can result in different bending characteristics. For instance, as shown in Figure 1229, side-mount polymer lamella develops very strong bending, so that further thinning is not possible. However, bottom-mount develops less bending.
[1] S. Kim et al., Ultramicroscopy, 111:191 – 199 (2011).
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