Lattice-Fringe/Structural Fingerprinting
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Lattice-fringe fingerprinting is especially a method to identify nanocrystals based on Fourier transforms of HRTEM (high-resolution transmission electron microscopy) images. Lattice-fringe fingerprinting requires a comprehensive database of crystallographic information in combination with search/match algorithms for identifying an unknown nanocrystal out of a range of candidate structures.

The technique of lattice-fringe fingerprinting uses the information in crossed lattice fringes that present in HRTEM images. The primary characteristics in the fringes are the spacing of the lattice fringes and the angle between intersecting lattice fringes. Instead of directly using the actual images, for lattice-fringe fingerprinting it is more convenient to use the Fourier transform of the HRTEM image (e.g. from fast Fourier transform, FFT). If the information of the spacings and angles is not sufficient to identify a crystal (e.g. nanocrystal), the phase information in the Fourier transform of the image should be employed. Phase determination requires determining the origin of a unit cell in the crystals. Note that lattice-fringe visibility can also help the lattice-fringe fingerprinting.

 

 

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