Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

EELS Analysis of Ferroelectric Materials

In EELS, perovskite type ferroelectric and high-k dielectric materials, such as BaTiO3 and SrTiO3, normally show only one interband plasmon peak [1–4].

 

 

 

 

[1] K.S. Katti, M. Qian, F. Dogan, M. Sarikaya, J. Am. Ceram. Soc. 85 (2002) 2236–2243.
[2] K. van Benthem, C. Elsasser, R.H. French, J. Appl. Phys. 90 (2001) 6156–6164.
[3] S. Schamm, G. Zanchi, Ultramicroscopy 88 (2001) 211–217.
[4] J. Zhang, A. Visinoiu, F. Heyroth, F. Syrowatka, M. Alexe, D. Hesse, H.S. Leipner, Phys. Rev. B 71 (2005) 064108.