Aberrations and Imaging Requirements
for Large Field of View in EMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The off-axial coma must be eliminated in order to provide a large field of view. The optical arrangement that satisfies these requirements is called aplanatic condition. In this case, the imaging characteristics do not vary for small angular beam tilts or with the position of the scatters, in the specimen, in the vicinity of the optic axis. However, the field astigmatism and the image curvature can diminish the resolution in the region far from the optic axis.

 

 

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