Aberrations and Imaging Requirements
for Small Field of View in EMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In the case of small field of view (e.g. at high magnifications), the dependence of wave aberration function (Wx,y) on the image plane can be negligible based on the isoplanatic approximation.

In the case of high-resolution TEM (HRTEM) under typical imaging conditions, the magnification is so large that the transferred object field is so small and thus, image curvature and field astigmatism do not appreciably affect the image quality.

 

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