Off-axial Coma and Field of View
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The off-axial coma of objective lenses in EMs determines the field of view of the recorded image.

 

 

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