This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

=================================================================================

Given a mixture of both crystalline and amorphous materials, the sharp diffraction spots in the Fourier transform or FFT of an HRTEM image originates from the periodic features in a TEM specimen, while the diffuse background in the Fourier transform or FFT originates from the amorphous materials.