Fourier Transform and FFT of HRTEM Image of Crystalline Materials
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Given a mixture of both crystalline and amorphous materials, the sharp diffraction spots in the Fourier transform or FFT of an HRTEM image originates from the periodic features in a TEM specimen, while the diffuse background in the Fourier transform or FFT originates from the amorphous materials.

 

 

 

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