Table 1773. Techniques that is used to analyze ferroelectric materials.
| Techniques |
Obtainable information |
Disadvantage |
Remark |
Reference |
Atomic force microscopy |
Domain structure |
Lack of quantitative information on orientation, strain & mesoscale dynamics within domains |
|
[5, 6] |
| EBSD |
Domain structure |
Lack of quantitative information on orientation, strain & mesoscale dynamics within domains |
|
[4] |
| Neutron diffraction |
|
Cannot apply to nanostructures due to its spatial resolution limitation |
|
|
| Optical microscopy |
Domain structure |
Lack of quantitative information on orientation, strain & mesoscale dynamics within domains |
|
[5, 6] |
| Synchrotron-based polychromatic Scanning XRay
Microdiffraction (μSXRD) |
Non-destructive, great penetration depth (> 20μm), strain resolution
(0.02%), crystallite orientation precision (0.01°) |
Cannot apply to nanostructures due to its spatial resolution limitation |
|
[7] |
| XRD |
Long range average |
Cannot apply to nanostructures due to its spatial resolution limitation |
|
|
| CBED in CTEM mode |
|
|
Cannot apply to nanostructures |
|
| CBED in STEM mode |
Two-dimensional (2D) distribution of small atomic displacements (~10 pm) |
|
The sensitivity to displacement is greater than other techniques (e.g. DPC) |
[9] |
| TEM |
Domain structure |
Lack of quantitative information on orientation, strain & mesoscale dynamics within domains |
|
[1,2] |
| Differential phase-contrast (DPC) imaging based on STEM |
Polarizations of domains in atomic resolution |
|
|
[8] |
| White beam topography |
Domain structure |
Lack of quantitative information on orientation, strain & mesoscale dynamics within domains |
|
[3] |
| XAFS/EXAFS |
Local order, local spatial and electronic structure, local distortions of crystal lattice |
|
|
|
| Capacitance measurements |
|
|
With Keithley 3330 LCZ meter at 0.1, 1, 10, and
100 kHz by heating to 150°C with 5°C/min heating rate and cooling back to room temperature |
|
[1] X. Tan, J. K. Shang, Journal of Applied Physics, 96, 5 (2004).
[2] K. A. Schönau, M. Knapp, H. Kungl, M. J. Hoffmann, H. Fuess, Physical Review B,
76, 14 (2007).
[3] X. R. Huang, S. S. Jiang, W. J. Liu, X. S. Wu, D. Feng, Z. G. Wang, V. Han, J. Y.
Wang, J. Appl. Cryst. 29, 371 (1996).
[4] F. Ernst, M. L. Mulvihill, O. Kienzle, M. Ruhle, J. Am. Ceram. Soc., 84, 8, 1885
(2001).
[5] S. Balakumar, J. B. Xu, J. X. Ma, S. Ganesamoorthy, I. H. Wilson, Jpn. J. Appl. Phys.,
36, 5566, (1997).
[6] S. V. Kalinin, D. A. Bonnell, Appl. Phys. Lett. 78, 1116 (2001).
[7] J-S Chung, G. E. Ice, Journal of Applied Physics, 86, 9, 5249 (1999).
[8] N. Shibata, S. D. Findlay, Y. Kohno, H. Sawada, Y. Kondo, and Y. Ikuhara, Nat. Phys. 8, 611–615 (2012).
[9] Kenji Tsuda, Akira Yasuhara, and Michiyoshi Tanaka, Two-dimensional mapping of polarizations of rhombohedral nanostructures in the tetragonal phase of BaTiO3 by the combined use of the scanning transmission electron microscopy and convergent-beam electron diffraction methods, Applied Physics Letters, 103, 082908 (2013).
|
