HRSTEM/High Resolution STEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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To obtain good-quality high-resolution HAADF STEM images, some requirements need to be satisfied:
         i) Very thin high-quality TEM films are needed because the STEM probes (especially Cs-corrected probes) have a short depth of focus. However, in many cases, this type of imaging cannot be successful because of the charging and damages of the thin specimens.
         ii) We need the same magnitude of defocus as that of the amorphous layer on the specimen surface that is used to adjust the Ronchigram.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.