Electron microscopy
 
Fourier Deconvolution Techniques for EELS/EFTEM
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

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For thick TEM specimens, plural scattering of electrons cannot be ignored so that the interpretation of EFTEM images and EEL spectra will not be straightforward. However, single scattering information can be restored using deconvolution techniques, e.g. Fourier deconvolution techniques. In practice, there are mainly two different Fourier deconvolution techniques:
        i) Fourier-log method.
        ii) Fourier-ratio method.

 

 

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