Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| ATE (Automated Test Equipment) refers to the systems used to automatically test devices, such as semiconductor wafers or electronic circuits, to ensure they meet specifications. For instance, 93k (Advantest V93000) is a popular and advanced Automated Test Equipment (ATE) used in semiconductor testing. It is designed to test integrated circuits (ICs), including both digital and mixed-signal devices. The V93000 platform is known for its flexibility, scalability, and high throughput, making it suitable for a wide range of testing applications, including scan-chain based Design-for-Test (DFT) methods.
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