Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| The resolution of electron microscopes (EMs) is partially limited by: i) The electrical stability of the EM systems, e.g. the stabilities of the high voltage and the lens currents; ii) External disturbances e.g. mechanical vibration, contamination, charging, fluctuation of stray magnetic fields, and the nonuniform magnetic properties of the pole-piece material used.
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