Range of Energy Losses of Various EELS Signals - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | |||||||||||||||||||||||
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Table 3166a lists the main characteristics (energy loss and scattering semiangle) of the four most common energy-loss processes when an incident electron beam is interacting with materials. However, in general, the intensities of all the energy-loss processes decrease with increase of scattering semiangles θ. Table 3166a. Main characteristics of the four most common energy-loss processes.
For EELS measurements, inelastic scattering events with energy losses up to ~2 keV are experimentally intense enough to be useful. Table 3166b. Properties of various EELS energy ranges.
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