Electron microscopy
 
Range of Energy Losses of Various EELS Signals
- Practical Electron Microscopy and Database -
- An Online Book -
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Table 3166 lists the main characteristics (energy loss and scattering semiangle) of the four most common energy-loss processes when an incident electron beam is interacting with materials. However, in general, the intensities of all the energy-loss processes decrease with increase of scattering semiangles θ.

Table 3166. Main characteristics of the four most common energy-loss processes.

Process
Energy loss (eV)
Scattering semiangle (mrads)
Phonon excitation
~0.03 5-40
Inter/intra-band transitions
5-25 5-10
Plasmon excitation
~5-30 <~0.1
Inner-shell ionization
~30-2000 1-20

 

 

 

 

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