Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| With high-brightness electron sources and aberration correctors, very large current density (> 106 A/cm2) in electron microscopes (EMs), especially in TEMs, can be obtained within a small electron probe in diameter (< 1 nm), resulting in displacement damage in stationary analysis or scanning over a limited area.
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