This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.

=================================================================================

Figure 4222 shows a SEM system with a reflection electron detecting/amplifying system.

Figure 4222. SEM system with a reflection electron detecting/amplifying system.