Ronchigram Depending on Accelerating Voltage of Electron Beam
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The Ronchigrams in STEMs operated at lower accelerating voltages have smaller semi-angles than those operated at higher accelerating voltages. These smaller semi-angles represent smaller flat-contrast areas where the probe coherently converges on specimens in STEMs.

 

 

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