Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Effect of Random Distribution of Atom Positions on Diffractograms

The noise intensity of diffractograms can be higher than the intensity of the Thon-ring signal itself. One of the reasons is due to the random distribution of the atom positions within amorphous objects.