Ion Beams and Their Applications as Detection Tools
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Scanning primary beam of ions has been used in many methods and techniques for imaging or modifying amorphous and crystalline materials, such as scanning helium ion microscopy (SHIM or HeIM), secondary ion mass spectrometry (SIMS), and focused ion beam (FIB).

 

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.