This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Zhu et al. [1] reported that TEM specimens were prepared from Zr–Nb–Cu–Ni–Al bulk metallic glasses using the ion-milling method with a low energy of ~2.0 keV. The icosahedral short-range ordering in the prepared specimens was examined with FFT patterns extracted from HRTEM images.