Zero Loss Extraction in EELS Analysis
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 2636 shows the EELS zero loss extraction using a power-law background model, giving a raw valence band spectrum and residual spectrum following subtraction of a power-law background model. The green arrow indicates a typical, artificially induced false feature, located in the energy region of 2-3 eV. This artifact can easily occur and is most likely induced by the incorrectly focused ZLP as during EELS alignment process the ZLP is normally optimized by only focusing the peak to maximize the intensity and less attention is paid to the low intensity tails.

EELS  zero loss extraction using a power-law background model

Figure 2636. EELS zero loss extraction using a power-law background model.

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.