Backscattered Electron Imaging Affected by
Accelerating Voltage of Electron Beam
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The extent of electron backscattering increases at low accelerating voltages of the incident electron beam, therefore, the contrast of the backscattered electron images is increased. However, the lower accelerating voltages reduce the contrast of STEM images.

 

 

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